An instrument used to determine the energy distribution of beta particles and secondary electrons.

A spectrometer which analyzes a substance with electron emissions that are induced by X-rays.

A spectrometer or an instrument that produces a spectrum; especially, one in which wavelength, energy, intensity, etc., can be measured based on electron paramagnetic resonance.

A type of secondary ion mass spectrometer (instrument used to disperse radiant energy or particles into a spectrum and measure properties such as wavelength, mass, energy, or index of refraction) in which primary ions are focused on a spot 1-2 micrometers in diameter, mass-charge separation of secondary ions is carried out by a double focusing mass spectrometer or spectrograph.

A magnified image of isotopic distributions on the sample surface is produced using synchronous scanning of the primary ion beam and an oscilloscope.

An instrument for microscopic chemical analysis, in which a beam of primary ions with an energy in the range 5-20 kilo-electron volts hit a small spot on the surface of a sample with high-energy particles, and positive and negative secondary ions sputtered from the surface are analyzed in a mass spectrometer.

1. A mass spectrometer in which the mass distribution of orbiting ions within a magnetic field is detected by bringing ion frequencies sequentially into resonance with applied radio frequencies.
2. A device for detecting and measuring the mass distribution of ions orbiting in an applied magnetic field, either by applying a constant radio-frequency signal and varying the magnetic field to bring ion frequencies equal to the applied radio frequency sequentially into resonance, or by rapidly varying the radio frequency and applying Fourier transform techniques (an operation that transforms one complex-valued function of a real variable into another one).

Fourier transform techniques as used in electronics, control systems engineering, and statistics, is a term used to describe the analysis of mathematical functions or signals with respect to frequency, rather than time.

An instrument for x-ray analysis of crystal structure and measuring wavelengths of X-rays and gamma rays, in which a homogeneous beam of X-rays is directed on the known face of a crystal and the reflected beam is detected in a suitably placed ionization chamber.

An analytical instrument in which ions, produced from a sample, are separated by electric or magnetic fields according to their ratios of charge to mass.

A record is produced (mass spectrum) of the types of ion present and their relative amounts.